• DocumentCode
    2794021
  • Title

    Tracking and erosion failure of silicone rubber in inclined-plane test

  • Author

    Xidong, Liang ; Jing, Li ; Jiaqi, Xue ; Renyu, Zhang

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    608
  • Abstract
    The mechanisms of tracking and erosion failure of high temperature vulcanized HTV silicone rubber were studied by means of the inclined-plane test. Test conditions were varied by using different kinds of electrolytic contamination solutions instead of the stipulated NH4Cl. Arc current I, arc burning, and extinguishing time ta and t0 were all recorded. Therefore, both the energy Ea dissipated on the sample surface in each ta and the average energy Et dissipated on the sample surface per minute could be calculated. Boiling temperatures Tb of different saturated contamination solutions were also measured. The tracking and erosion test results of silicone rubber showed a good correspondence with Ea and Tb, but a poor correspondence with Et. The higher the Ea and Tb, the severer the tracking and erosion damage of test samples. This means that the tracking and erosion failure of silicone rubber in the inclined-plane test is mainly caused by the heat absorbed on a simple surface in each arc burning time, and the actions of successively burned arcs are independent
  • Keywords
    composite insulating materials; electric breakdown of solids; failure analysis; insulation testing; rubber; silicones; surface discharges; arc burning time; arc current; electrolytic contamination solutions; erosion failure; extinguishing time; inclined-plane test; silicone rubber; tracking; Absorption; Aging; Circuit testing; Rubber; Sparks; Sun; Surface resistance; Surface treatment; Underwater tracking; Water pollution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172132
  • Filename
    172132