• DocumentCode
    2794062
  • Title

    A simple mobility model for electrons and holes

  • Author

    Takata, Tkunori

  • Author_Institution
    Ind. Electron. & Syst. Lab., Mitsubishi Electr. Corp., Amagasaki, Japan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    269
  • Lastpage
    272
  • Abstract
    This article reports a trial to find a simple quantitative relation which explains drift mobilities for electrons and holes in various semiconductors on the same point of view as the saturation velocity analysis which was presented at ISPSD´97 by the author (Takata, Proc. ISPSD´97, pp. 133-136, 1997). A newly proposed model was based on the primitive mobility equation (μd=q·τm /mdr*) and the factors which determine a momentum relaxation time (τm=Lm/veff) were chosen such that a mean free path (Lm) was equal to the lattice constant (a) times 40 (Lm≈40·a) and the effective velocity (veff) equalled the thermal velocity (v th). Then the author tried to find the simplest rule for effective masses (mdr*) to explain the experimental values for electrons and holes in the major indirect-transition-type semiconductors, such as diamond, 4H-SiC, 6H-SiC, 3C-SiC, Si, GaP, AlSb, Ge and GaAs. On many materials, the conductive effective mass (mc*) is fitting for the electron´s effective mass (mdr*) and the longitudinal effective mass (m1*) for the hole´s. This model may be useful for evaluation of approximate mobilities for newly developing materials such as SiC or diamond. The author proposes that conventional transport theory has serious problems for such materials, especially in terms of holes. Even if the theory of this paper is not solid, there is room to discuss some new fundamental mechanisms on these subjects
  • Keywords
    III-V semiconductors; aluminium compounds; carrier mean free path; carrier relaxation time; diamond; effective mass; electrical conductivity; electron mean free path; electron mobility; electron relaxation time; elemental semiconductors; gallium arsenide; gallium compounds; germanium; hole mobility; silicon; silicon compounds; wide band gap semiconductors; 3C-SiC; 4H-SiC; 6H-SiC; AlSb; C; GaAs; GaP; Ge; Si; SiC; approximate mobility; conductive effective mass; diamond; drift mobility; effective masses; effective velocity; electron effective mass; electron mobility model; hole effective mass; hole mobility model; indirect-transition-type semiconductors; lattice constant; longitudinal effective mass; mean free path; momentum relaxation time; primitive mobility equation; saturation velocity analysis; semiconductors; thermal velocity; transport theory; Charge carrier processes; Conducting materials; Effective mass; Electron mobility; Equations; Gallium arsenide; Lattices; Semiconductor materials; Silicon carbide; Thermal factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1999. ISPSD '99. Proceedings., The 11th International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-5290-4
  • Type

    conf

  • DOI
    10.1109/ISPSD.1999.764115
  • Filename
    764115