• DocumentCode
    2794138
  • Title

    AC fault ride-through capability of a VSC-HVDC transmission systems

  • Author

    Adam, G.P. ; Ahmed, K.H. ; Finney, S.J. ; Williams, B.W.

  • Author_Institution
    Electron. & Electr. Eng. Dept., Univ. of Strathclyde, Glasgow, UK
  • fYear
    2010
  • fDate
    12-16 Sept. 2010
  • Firstpage
    3739
  • Lastpage
    3745
  • Abstract
    This paper presents a recovery strategy that enables DC transmission systems based on voltage source converters to ride-through different ac faults with minimum current and voltage stresses on the converter switching devices. The proposed recovery strategy eliminates the trapped energy in the dc link during ac faults; as a result the rise in the dc link voltage is prevented. This may eliminate the need for the dc chopper in the dc link, as proposed in the literature, to dissipate the trapped energy. To demonstrate the effectiveness of the recovery strategy, several fault conditions are considered, including, symmetrical and asymmetrical faults. The proposed recovery strategy improves the resiliency of the VSC-HVDC transmission system to different ac faults, which can be summarized as follows: limited current contribution to the fault and limited current and voltage stress on the switching devices as the rise in the dc link voltage is significantly reduced or prevented.
  • Keywords
    HVDC power transmission; choppers (circuits); power convertors; power transmission faults; AC fault ride-through capability; VSC-HVDC transmission systems; converter switching devices; dc chopper; dc link voltage; limited current contribution; limited current stress; limited voltage stress; voltage source converters; Circuit faults; Control systems; Power conversion; Reactive power; Stress; Voltage control; AC fault ride-through capability; sinusoidal pulse width modulation; static synchronous compensator; voltage source converter based dc transmission system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-5286-6
  • Electronic_ISBN
    978-1-4244-5287-3
  • Type

    conf

  • DOI
    10.1109/ECCE.2010.5617786
  • Filename
    5617786