DocumentCode :
2794143
Title :
Using TRIZ, parametric modeling, FEA simulation, and rapid prototyping to foster creative design
Author :
Kitto, Kathleen L.
Author_Institution :
Dept. of Eng. Technol., Western Washington Univ., Bellingham, WA, USA
Volume :
2
fYear :
2000
fDate :
2000
Abstract :
Fostering creative design within the curriculum in engineering and engineering technology is often both daunting and time-consuming. This paper describes the efforts in the Engineering Technology Department at Western Washington University to foster creative design within the curriculum by using TRIZ, parametric modeling, finite element analysis (FEA) simulation, and rapid prototyping. First, the paper describes how assessment enabled the faculty to create a collaborative environment. Second, the introduction to the design process using parametric modeling and 3D printing rapid prototyping technology during the freshman experience is described. Next, the paper describes TRIZ, the Theory of Inventive Problem Solving, in detail and how that philosophy can be used within an academic setting to foster both creativity and efficient product and process design. Then the paper details how TRIZ, FEA simulation and Fused Deposition Modeling (FDM) are actually used in the senior year. The paper concludes with the results of the department´s assessment efforts and plans for future
Keywords :
engineering computing; finite element analysis; rapid prototyping (industrial); FEA simulation; Fused Deposition Modeling; TRIZ; Theory of Inventive Problem Solving; collaborative environment; creative design; engineering technology; finite element analysis; parametric modeling; rapid prototyping; Analytical models; Collaboration; Design engineering; Finite element methods; Parametric statistics; Printing; Problem-solving; Process design; Prototypes; Virtual prototyping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frontiers in Education Conference, 2000. FIE 2000. 30th Annual
Conference_Location :
Kansas City, MO
ISSN :
0190-5848
Print_ISBN :
0-7803-6424-4
Type :
conf
DOI :
10.1109/FIE.2000.896654
Filename :
896654
Link To Document :
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