Title :
Mechanism for the initial current gain increase in carbon-doped heterostructure bipolar transistors
Author :
Chi, J.Y. ; Lu, K.
Author_Institution :
MA-COM Corp. R&D Center, Lowell, MA, UASA
Abstract :
This talk reports a new finding that after the initial rise, the current gain of carbon-doped AlGaAs/GaAs HBTs can be re-initiated by a 200-300°C annealing under no bias. The re-initiating is nondestructive and reproducible, therefore permitting unambiguous study of the phenomenon. A simple physical model was described to explains all the experimental results obtained on the re-initiation phenomenon
Keywords :
III-V semiconductors; aluminium compounds; annealing; carbon; gallium arsenide; heterojunction bipolar transistors; 200 to 300 C; AlGaAs-GaAs:C; AlGaAs/GaAs HBT; annealing; carbon-doped heterostructure bipolar transistor; current gain; re-initiation; Annealing; Bipolar transistors; Doping; Electrons; Gallium arsenide; Hydrogen; MOCVD; Packaging; Protons; Temperature;
Conference_Titel :
GaAs Reliability Workshop, 1997., Proceedings
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7908-0064-0
DOI :
10.1109/GAASRW.1997.657046