Title :
The Role of OEICs in Commercial Applications
Author_Institution :
IBM T.J. Watson Research Center, Yorktown Heights, New York
Keywords :
Circuit testing; Detectors; High speed optical techniques; Optical fiber communication; Optical fibers; Optical materials; Optical receivers; Optical sensors; Optoelectronic devices; Parasitic capacitance;
Conference_Titel :
Flat Panel Display Technology/Technologies for a Global Information Infrastructure/ICs for New Age Lightwave Communications/RF Optoelectronics, 1995 Digest of the LEOS Summer Topical Meetings
Conference_Location :
Keystone, CO, USA
Print_ISBN :
0-7803-2448-X
DOI :
10.1109/LEOSST.1995.764148