DocumentCode :
2794636
Title :
An integrated manufacturing data management system
Author :
Beach, Mark J. ; Jones, Alan C.
Author_Institution :
IBM Applications Bus. Syst., Rochester, MN, USA
fYear :
1990
fDate :
1-3 Oct 1990
Firstpage :
306
Lastpage :
311
Abstract :
A flexible data management system (FDMS) that supports the collection, management, and analysis of production data for a 3-1/2-in disk drive product is described. This system consists of several personal computers and Personal System 2 computers connected via a token ring network and can be extended to support any type of assembly manufacturing. FDMS supports the following: (1) collection of pass-fail and parametric data from workstations and testers throughout the manufacturing floor; (2) ability to query these data, based on the serialized component, record type, date/time, or combinations of these; (3) ability to display statistical process control (SPC) charts based on any of the parameters collected from the testers and or workstations in real time; (4) automatic rework calls and parts disposition provided via an expert system application; (5) a method for users to define new or change existing data record formats to the system that requires no code changes to any of the support programs; (6) support of high-volume production via a distributed database architecture; (7) support for a management aid engineering reporting system; and (8) software level control distribution of computer programs and process data such as microcode or machine instructions to any node on the network
Keywords :
assembling; distributed databases; expert systems; manufacturing data processing; statistical process control; token networks; Personal System 2 computers; automatic rework calls; disk drive product; distributed database architecture; expert system application; flexible data management system; high-volume production; integrated manufacturing data management system; parametric data; pass-fail data; production data; reporting system; software level control distribution; statistical process control; token ring network; workstations; Automatic testing; Computer aided manufacturing; Computer networks; Data analysis; Disk drives; Microcomputers; Production systems; Software testing; System testing; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1990 Proceedings, Competitive Manufacturing for the Next Decade. IEMT Symposium, Ninth IEEE/CHMT International
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/IEMT9.1990.115023
Filename :
115023
Link To Document :
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