DocumentCode :
2794835
Title :
Nonintrusive Black- and White-Box Testing of Embedded Systems Software against UML Models
Author :
Graf, Philipp ; Müller, Klaus D. ; Reichmann, Clemens
Author_Institution :
Univ. of Karlsruhe, Karlsruhe
fYear :
2007
fDate :
28-30 May 2007
Firstpage :
130
Lastpage :
138
Abstract :
We extend a model based development approach for software components of embedded systems by a model based testing framework. We motivate by describing challenges a developer has to face when developing embedded software and present as a solution an UML-centric development approach. We introduce a testing framework that allows specification of test cases for UML class models using UML sequence- and use-case-diagrams. These test cases define participating objects and their messages including parameters, loops, control structures, inclusion of other collaborations and time constraints. These diagrams are verified against the real system-response of the software under test. We employ a commercial in-circuit emulator to record method calls, object identities and their parameters on C source-code level as messages with minimal impact on system performance and map these back to model level to verify them against the specified model.
Keywords :
Unified Modeling Language; embedded systems; formal specification; object-oriented programming; program control structures; program testing; program verification; C source-code level; UML class models; UML sequence; black-box testing; embedded systems software; method calls; model based development; model based testing; object identities; program control structures; program loops; program parameters; program verification; software components; software testing; use-case-diagrams; white-box testing; Actuators; Control systems; Embedded software; Embedded system; Hardware; Object oriented modeling; Software systems; Software testing; System testing; Unified modeling language;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Rapid System Prototyping, 2007. RSP 2007. 18th IEEE/IFIP International Workshop on
Conference_Location :
Porto Alegre
ISSN :
1074-6005
Print_ISBN :
0-7695-2834-1
Type :
conf
DOI :
10.1109/RSP.2007.30
Filename :
4228496
Link To Document :
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