• DocumentCode
    2794963
  • Title

    A new approach to breakdown voltage and nondestructive parameters of micaceous insulation systems

  • Author

    Kimura, Ken ; Kaneda, Yoshiharu ; Itoh, Keiichi

  • Author_Institution
    Mitsubishi Electric Corp., Amagasaki, Japan
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    769
  • Abstract
    A novel mathematical approach is proposed to calculate the breakdown voltage and nondestructive parameters in connection with the internal state of aged micaceous insulation systems. After a short review of the conventional cumulative aging theory, it is pointed out that residual breakdown data do not always obey the theory, and that the internal change observed with SEM (scanning electron microscopy) seems to reflect on the measured values. To explain the phenomena comprehensively, the concept of `defect distribution X´ is introduced. Breakdown voltage and nondestructive parameters are shown to be derived from the distribution X. An example of a simulation is presented
  • Keywords
    ageing; electric breakdown of solids; insulating materials; scanning electron microscope examination of materials; SEM; aging theory; breakdown voltage; defect distribution; internal state; micaceous insulation systems; nondestructive parameters; Aging; Dielectrics and electrical insulation; Electric breakdown; Fatigue; Performance evaluation; Rotating machines; Rotation measurement; Testing; Thermal stresses; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172180
  • Filename
    172180