• DocumentCode
    2795164
  • Title

    Magnetic properties measurement of soft magnetic composite materials over wide range of excitation frequency

  • Author

    Li, Yongjian ; Zhu, Jianguo ; Yang, Qingxin ; Lin, Zhi Wei ; Wang, Yi ; Xu, Wei

  • Author_Institution
    Province-Minist. Joint Key Lab. of Electromagn. Field & Electr. Apparatus Reliability, Hebei Univ. of Technol., Tianjin, China
  • fYear
    2010
  • fDate
    12-16 Sept. 2010
  • Firstpage
    2259
  • Lastpage
    2265
  • Abstract
    Accurate measurements of magnetic properties of soft magnetic composite (SMC) material are performed on an improved 3D tester by means of novel precision B-H sensing coils attached to the surface of the specimen. By controlling the adjustable excitation topologies, magnetic properties over wide excitation frequency range from 2 Hz to 1000 Hz are acquired and analyzed. In this paper, the relationship between the magnetic flux density vector B and magnetic field strength vector H has been systematically measured under alternating and 3D conditions, and the core loss features have been analyzed. Compared with the conventional magnetic properties only at 50 Hz, wide-range-frequency magnetic properties contribute to extending application area of the new SMC electrical machines.
  • Keywords
    composite materials; magnetic fields; magnetic flux; magnetic variables measurement; soft magnetic materials; B-H sensing coil; excitation frequency; frequency 2 Hz to 1000 Hz; magnetic field strength vector; magnetic flux density vector; magnetic properties measurement; soft magnetic composite material; Coils; Core loss; Magnetic field measurement; Magnetic flux density; Magnetic properties; Sensors; Three dimensional displays; Anisotropy; Flexible excitation coil; Improved 3D magnetic testing system; Rotational magnetization; Sensing coil; Soft magnetic composite (SMC); Wide-range-frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-5286-6
  • Electronic_ISBN
    978-1-4244-5287-3
  • Type

    conf

  • DOI
    10.1109/ECCE.2010.5617845
  • Filename
    5617845