Title :
Tailoring test process by using the component-based development paradigm and the XML technology
Author :
Seo, Jooyoung ; Choi, Byoungju
Author_Institution :
Dept. of Comput. Sci. & Eng., Ewha Woman´´s Univ., Seoul, South Korea
Abstract :
ISO (International Standardization Organization) and the IEC (International Electrotechnical Commission) provide numerous standards for software products and processes. Utilizing those standards specific to a project requires some tailoring to meet the development domain. This paper includes: (1) a test process meta-model, which is a test process defined in standards; (2) “a scheme for tailoring processes” following a component-based development customization technique; and (3) AutoTP, an “automation tool for tailoring”, which is derived from XML techniques. AutoTP is a tool in which a standard test process automatically generates a tailored test process by means of a methodology and a domain. In addition, the Rational Objectory process is used as an empirical study in this paper
Keywords :
IEC standards; ISO standards; computer aided software engineering; hypermedia markup languages; program testing; software process improvement; software standards; software tools; subroutines; AutoTP; Extensible Markup Language; IEC; ISO; Rational Objectory process; XML technology; automation tool; component-based development customization technique; component-based development paradigm; process tailoring scheme; project-specific standards; software processes; software products; software test process customization; test process meta-model; Automatic testing; Automation; Component architectures; Computer science; IEC standards; ISO standards; Software standards; Standards development; Standards organizations; XML;
Conference_Titel :
Software Engineering Conference, 2000. APSEC 2000. Proceedings. Seventh Asia-Pacific
Print_ISBN :
0-7695-0915-0
DOI :
10.1109/APSEC.2000.896720