DocumentCode
2795463
Title
Improved Multi Angled Parallelism for separation of text from intersecting linear features in scanned topographic maps
Author
Pezeshk, Aria ; Tutwiler, Richard L.
Author_Institution
Appl. Res. Lab., Pennsylvania State Univ., State College, PA, USA
fYear
2010
fDate
14-19 March 2010
Firstpage
1078
Lastpage
1081
Abstract
Separation of the text and graphics layers in maps with dense and overlapping sets of features (e.g. topographic maps) is a challenging problem. Multi Angled Parallelism (MAP) provides an efficient tool to detect miscellaneous linear features using directional morphological operations and higher order feature representation. However, in its original formulation sides of characters, short lines, and parts of lines that pass through characters are often misclassified. This paper presents an improvement over MAP to automatically extract complete line networks with arbitrary orientation and curvature even when they pass through characters with minimal impact on the text content. The resulting text only image can then be processed for text grouping, reorientation, and recognition. The proposed algorithm does not rely on heuristics and can be easily adapted to work with maps of various scales and sources and other line drawing images by adjusting only a small number of parameters.
Keywords
cartography; feature extraction; geographic information systems; image recognition; image representation; text analysis; directional morphological operations; higher order feature representation; multiangled parallelism; scanned topographic maps; text grouping; text only image; text recognition; text reorientation; text separation; Computer vision; Data mining; Educational institutions; Engineering drawings; Feature extraction; Geographic Information Systems; Graphics; Morphological operations; Roads; Text recognition; Feature Extraction; Mathematical Morphology; Multi Angled Parallelism; Text Extraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Acoustics Speech and Signal Processing (ICASSP), 2010 IEEE International Conference on
Conference_Location
Dallas, TX
ISSN
1520-6149
Print_ISBN
978-1-4244-4295-9
Electronic_ISBN
1520-6149
Type
conf
DOI
10.1109/ICASSP.2010.5495342
Filename
5495342
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