Title :
A review of analog automatic test generation
Author :
Schreiber, Heinz H.
Author_Institution :
Grumman Aerospace Corporation
Keywords :
Acoustic testing; Aerospace testing; Analytical models; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Optical noise; Steady-state;
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
DOI :
10.1109/AUTEST.1978.764226
