DocumentCode
2795505
Title
A review of analog automatic test generation
Author
Schreiber, Heinz H.
Author_Institution
Grumman Aerospace Corporation
fYear
1978
fDate
1978
Firstpage
1
Lastpage
8
Keywords
Acoustic testing; Aerospace testing; Analytical models; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Optical noise; Steady-state;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '78. International Automatic Testing Conference
Type
conf
DOI
10.1109/AUTEST.1978.764226
Filename
764226
Link To Document