DocumentCode :
2795597
Title :
A processor for testing mixed-signal cores in system-on-chip
Author :
Duarte, Francisco ; da Silva, J. Machado ; Alves, José C. ; Pinho, G.A. ; Matos, José S.
Author_Institution :
Fac. de Engenharia, Porto Univ., Portugal
fYear :
2005
fDate :
30 Aug.-3 Sept. 2005
Firstpage :
184
Lastpage :
191
Abstract :
This paper describes the design of a processor specific for testing cores embedded in system-on-chip. This processor, which can be implemented within a system´s reconfigurable area, shall be responsible for scheduling and control test operations and perform preliminary data processing, as well as to provide the interface with an external tester. Building these test operations on-chip allows for simplifying external tester interface and to reduce testing time. The testing procedure and the infrastructure required to test an A/D converter is described as an example.
Keywords :
field programmable gate arrays; integrated circuit testing; logic testing; mixed analogue-digital integrated circuits; system-on-chip; A/D converter testing; external tester interface; mixed-signal core testing; preliminary data processing; system-on-chip; test operation control; Automatic testing; Built-in self-test; Circuit testing; Field programmable gate arrays; Logic arrays; Logic testing; Performance evaluation; Processor scheduling; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design, 2005. Proceedings. 8th Euromicro Conference on
Print_ISBN :
0-7695-2433-8
Type :
conf
DOI :
10.1109/DSD.2005.11
Filename :
1559798
Link To Document :
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