DocumentCode
2795597
Title
A processor for testing mixed-signal cores in system-on-chip
Author
Duarte, Francisco ; da Silva, J. Machado ; Alves, José C. ; Pinho, G.A. ; Matos, José S.
Author_Institution
Fac. de Engenharia, Porto Univ., Portugal
fYear
2005
fDate
30 Aug.-3 Sept. 2005
Firstpage
184
Lastpage
191
Abstract
This paper describes the design of a processor specific for testing cores embedded in system-on-chip. This processor, which can be implemented within a system´s reconfigurable area, shall be responsible for scheduling and control test operations and perform preliminary data processing, as well as to provide the interface with an external tester. Building these test operations on-chip allows for simplifying external tester interface and to reduce testing time. The testing procedure and the infrastructure required to test an A/D converter is described as an example.
Keywords
field programmable gate arrays; integrated circuit testing; logic testing; mixed analogue-digital integrated circuits; system-on-chip; A/D converter testing; external tester interface; mixed-signal core testing; preliminary data processing; system-on-chip; test operation control; Automatic testing; Built-in self-test; Circuit testing; Field programmable gate arrays; Logic arrays; Logic testing; Performance evaluation; Processor scheduling; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Digital System Design, 2005. Proceedings. 8th Euromicro Conference on
Print_ISBN
0-7695-2433-8
Type
conf
DOI
10.1109/DSD.2005.11
Filename
1559798
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