• DocumentCode
    2795597
  • Title

    A processor for testing mixed-signal cores in system-on-chip

  • Author

    Duarte, Francisco ; da Silva, J. Machado ; Alves, José C. ; Pinho, G.A. ; Matos, José S.

  • Author_Institution
    Fac. de Engenharia, Porto Univ., Portugal
  • fYear
    2005
  • fDate
    30 Aug.-3 Sept. 2005
  • Firstpage
    184
  • Lastpage
    191
  • Abstract
    This paper describes the design of a processor specific for testing cores embedded in system-on-chip. This processor, which can be implemented within a system´s reconfigurable area, shall be responsible for scheduling and control test operations and perform preliminary data processing, as well as to provide the interface with an external tester. Building these test operations on-chip allows for simplifying external tester interface and to reduce testing time. The testing procedure and the infrastructure required to test an A/D converter is described as an example.
  • Keywords
    field programmable gate arrays; integrated circuit testing; logic testing; mixed analogue-digital integrated circuits; system-on-chip; A/D converter testing; external tester interface; mixed-signal core testing; preliminary data processing; system-on-chip; test operation control; Automatic testing; Built-in self-test; Circuit testing; Field programmable gate arrays; Logic arrays; Logic testing; Performance evaluation; Processor scheduling; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design, 2005. Proceedings. 8th Euromicro Conference on
  • Print_ISBN
    0-7695-2433-8
  • Type

    conf

  • DOI
    10.1109/DSD.2005.11
  • Filename
    1559798