Title :
Analog atpg: a response to users´needs
Author :
Bedrosian, Samuel D.
Author_Institution :
University of Pennsylvania
Keywords :
Automatic test pattern generation; Circuit testing; Fault diagnosis; Learning automata; Maintenance; Marine vehicles; Military computing; Reliability engineering; Systems engineering and theory; Test equipment;
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
DOI :
10.1109/AUTEST.1978.764233
