• DocumentCode
    2795768
  • Title

    Study of space charge in polyethylene for cable insulation by direct probing

  • Author

    Suzuoki, Y. ; Matsukawa, H. ; Han, S.O. ; Mizutani, T. ; Ieda, M. ; Yoshifuji, N.

  • Author_Institution
    Dept. of Electr. Eng., Nagoya Univ., Japan
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    938
  • Abstract
    By utilizing the laser-induced-pressure-pulse (LIPP) technique, the authors quantitatively studied the behavior of space charge in polyethylene (PE) for cable insulation to clarify the space charge effects in power cables. Effects of crosslinking, carbon-loaded semiconducting layer and additives (antioxidant) are reported. Crosslinked polyethylene (XLPE) with metal electrodes showed negative homo charge near the cathode, suggesting that crosslinking enhances electron injection into polyethylene. XLPE with a carbon-loaded semiconducting layer showed both negative and positive homo charges near the semiconducting layers, indicating that both electrons and holes were injected from the semiconducting layer. The antioxidant greatly enhanced the accumulation of negative hetero space charge near the anode and thus enhanced the anode field. Space charge distribution in a cable sample was also observed
  • Keywords
    cable insulation; organic insulating materials; polymers; power cables; space charge; LIPP; XLPE; additives; anode field; antioxidant; cable insulation; carbon-loaded semiconducting layer; crosslinking; direct probing; electron injection; laser induced pressure pulse technique; metal electrodes; negative hetero space charge; negative homo charge; polyethylene; positive homo charges; power cables; space charge; Anodes; Cable insulation; Cathodes; Electrodes; Polyethylene; Power cables; Power lasers; Semiconductivity; Semiconductor lasers; Space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172226
  • Filename
    172226