DocumentCode :
2795817
Title :
Real-time life consumption power modules prognosis using on-line rainflow algorithm in metro applications
Author :
Musallam, Mahera ; Johnson, C. Mark ; Yin, Chunyan ; Bailey, Chris ; Mermet-Guyennet, Michel
Author_Institution :
Electr. & Electron. Eng. Dept., Univ. of Nottingham, Nottingham, UK
fYear :
2010
fDate :
12-16 Sept. 2010
Firstpage :
970
Lastpage :
977
Abstract :
A real-time prognostic tool to predict life-time of IGBT power modules in a metro application is presented. Applying conventional life models (e.g. Coffin-Manson) for real applications is infeasible because these models are only applicable to cyclic data. Use of off-line rainflow algorithm is common solution but cannot be applied in real-time in its original form. This paper presents on-line life-estimation of the power modules using real-time rainflow coding algorithm. This technique is applied to an example metro application that requires use of cycle counting for an arbitrary load profile. The proposed method uses a stack-based implementation which employs a recursive algorithm to identify full and half cycles of the temperatures obtained as outputs from real-time compact thermal models. This then allows life-time models to be used to provide life consumption estimates. This method provides less complexity and more accurate on-line prediction for the studied module´s failure mechanisms.
Keywords :
insulated gate bipolar transistors; power semiconductor devices; real-time systems; semiconductor device reliability; IGBT power modules; metro applications; on-line life-estimation; on-line rainflow algorithm; real-time life consumption power modules prognosis; Load modeling; Mathematical model; Multichip modules; Predictive models; Real time systems; Reliability; Temperature measurement; Electro-thermal models; IGBT; Physics-of-failure; Power electronics; Prognosis; Rail traction; Rainflow algorithm; Real-time; Reliability; Thermal cycling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-5286-6
Electronic_ISBN :
978-1-4244-5287-3
Type :
conf
DOI :
10.1109/ECCE.2010.5617883
Filename :
5617883
Link To Document :
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