Title :
Analog automatic test generation development program
Author :
Grimes, Rodney E.
Author_Institution :
Department of the Air Force
Keywords :
Aerospace electronics; Automatic test equipment; Automatic testing; Circuit faults; Circuit testing; Fault diagnosis; Integrated circuit technology; Isolation technology; System testing; Weapons;
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
DOI :
10.1109/AUTEST.1978.764249
