DocumentCode :
2795869
Title :
Analog automatic test generation development program
Author :
Grimes, Rodney E.
Author_Institution :
Department of the Air Force
fYear :
1978
fDate :
1978
Firstpage :
124
Lastpage :
125
Keywords :
Aerospace electronics; Automatic test equipment; Automatic testing; Circuit faults; Circuit testing; Fault diagnosis; Integrated circuit technology; Isolation technology; System testing; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
Type :
conf
DOI :
10.1109/AUTEST.1978.764249
Filename :
764249
Link To Document :
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