• DocumentCode
    2795869
  • Title

    Analog automatic test generation development program

  • Author

    Grimes, Rodney E.

  • Author_Institution
    Department of the Air Force
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    124
  • Lastpage
    125
  • Keywords
    Aerospace electronics; Automatic test equipment; Automatic testing; Circuit faults; Circuit testing; Fault diagnosis; Integrated circuit technology; Isolation technology; System testing; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '78. International Automatic Testing Conference
  • Type

    conf

  • DOI
    10.1109/AUTEST.1978.764249
  • Filename
    764249
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2795869