DocumentCode :
2795944
Title :
Computer Aided Testability
Author :
Fennell, Thomas L. ; Nicolino, Thomas A.
Author_Institution :
Rome Air Development Center
fYear :
1984
fDate :
1984
Firstpage :
6
Lastpage :
11
Keywords :
Aerospace testing; Automatic testing; Circuit faults; Circuit testing; Costs; Design automation; Electronic equipment testing; Military computing; Process design; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
Type :
conf
DOI :
10.1109/RAMS.1984.764254
Filename :
764254
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2795944
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