• DocumentCode
    2796073
  • Title

    What is the real quality factor of an ultrafast planar photonic microcavity?

  • Author

    Hartsuiker, Alex ; Mosk, Allard P. ; Nowicki-Bringuier, Yoanna-Reine ; Gerard, Jean-Michel ; Vos, Willem L.

  • Author_Institution
    Center for Nanophotonics, FOM Inst. for Atomic & Mol. Phys. (AMOLF), Amsterdam, Netherlands
  • fYear
    2009
  • fDate
    14-19 June 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    We perform ultrafast time resolved autocorrelation measurements of a microcavity to deduce the quality factor. This value agrees well with transfer matrix calculations, but is higher than found from spectroscopic measurements.
  • Keywords
    III-V semiconductors; Q-factor; aluminium compounds; gallium arsenide; high-speed optical techniques; microcavities; optical correlation; time resolved spectra; GaAs-AlAs; quality factor; spectroscopic measurement; transfer matrix calculation; ultrafast planar photonic microcavity; ultrafast time resolved autocorrelation measurement; Autocorrelation; Microcavities; Optical reflection; Performance evaluation; Q factor; Q measurement; Resonance; Spectroscopy; Time measurement; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-4079-5
  • Electronic_ISBN
    978-1-4244-4080-1
  • Type

    conf

  • DOI
    10.1109/CLEOE-EQEC.2009.5192616
  • Filename
    5192616