Title :
What is the real quality factor of an ultrafast planar photonic microcavity?
Author :
Hartsuiker, Alex ; Mosk, Allard P. ; Nowicki-Bringuier, Yoanna-Reine ; Gerard, Jean-Michel ; Vos, Willem L.
Author_Institution :
Center for Nanophotonics, FOM Inst. for Atomic & Mol. Phys. (AMOLF), Amsterdam, Netherlands
Abstract :
We perform ultrafast time resolved autocorrelation measurements of a microcavity to deduce the quality factor. This value agrees well with transfer matrix calculations, but is higher than found from spectroscopic measurements.
Keywords :
III-V semiconductors; Q-factor; aluminium compounds; gallium arsenide; high-speed optical techniques; microcavities; optical correlation; time resolved spectra; GaAs-AlAs; quality factor; spectroscopic measurement; transfer matrix calculation; ultrafast planar photonic microcavity; ultrafast time resolved autocorrelation measurement; Autocorrelation; Microcavities; Optical reflection; Performance evaluation; Q factor; Q measurement; Resonance; Spectroscopy; Time measurement; Transmission line matrix methods;
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
DOI :
10.1109/CLEOE-EQEC.2009.5192616
