DocumentCode :
2796157
Title :
Remote path delay fault simulation
Author :
Gjermundnes, Øystein ; Aas, Einar J.
Author_Institution :
Dept. of Electron. & Telecommun;, NTNU, Trondheim, Norway
fYear :
2005
fDate :
30 Aug.-3 Sept. 2005
Firstpage :
428
Lastpage :
434
Abstract :
This paper describes the design of a remote fault simulator for delay faults that can be used by students to investigate the effect of different stimuli generators for different types of delay fault models.
Keywords :
delay circuits; fault simulation; integrated circuit testing; delay fault model; remote path delay fault simulation; Circuit faults; Circuit simulation; Circuit testing; Delay effects; Electrical fault detection; Electronic design automation and methodology; Fault detection; Microelectronics; Moore´s Law; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design, 2005. Proceedings. 8th Euromicro Conference on
Print_ISBN :
0-7695-2433-8
Type :
conf
DOI :
10.1109/DSD.2005.68
Filename :
1559836
Link To Document :
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