XRD, XPS and SEM Characterization of Photoconductive CdS Layers Deposited by Vacuum Thermal Evaporation

Author

Shindov, Peter ; Philipov, Philip ; Kakanakov, Rumen ; Kaneva, Svetlana ; Anastasova, Theodora

Author_Institution

Tech. Univ. of Sofia, Sofia

fYear

2007

fDate

9-13 May 2007

Firstpage

219

Lastpage

222

Abstract

Thin CdS-layers, formed by vacuum thermal evaporation were put to pulse rate laser treatment in order to receive a CdO-layer as covering on them, through which activation and recrystallization of the layers were carried out. The so formed heterostructure: CdS-CdO was put to thermal treatment for the purpose of changing its properties. The CdO layer was removed after carrying out the activation and recrystallization.

Keywords

II-VI semiconductors; X-ray diffraction; X-ray photoelectron spectra; cadmium compounds; evaporation; photoconducting materials; recrystallisation; scanning electron microscopy; vacuum deposition; wide band gap semiconductors; CdO; CdO layer; CdS; II-VI semiconductors; SEM; XPS; XRD; heterostructure; photoconductive CdS layers; pulse rate laser treatment; recrystallization; thermal treatment; vacuum thermal evaporation; Crystallization; Detectors; Optical pulses; Photoconductivity; Photovoltaic cells; Powders; Scanning electron microscopy; Surface treatment; X-ray diffraction; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Technology, 30th International Spring Seminar on

Conference_Location

Cluj-Napoca

Print_ISBN

987-1-4244-1218-1

Electronic_ISBN

987-1-4244-1218-1

Type

conf

DOI

10.1109/ISSE.2007.4432851

Filename

4432851