Title :
XRD, XPS and SEM Characterization of Photoconductive CdS Layers Deposited by Vacuum Thermal Evaporation
Author :
Shindov, Peter ; Philipov, Philip ; Kakanakov, Rumen ; Kaneva, Svetlana ; Anastasova, Theodora
Author_Institution :
Tech. Univ. of Sofia, Sofia
Abstract :
Thin CdS-layers, formed by vacuum thermal evaporation were put to pulse rate laser treatment in order to receive a CdO-layer as covering on them, through which activation and recrystallization of the layers were carried out. The so formed heterostructure: CdS-CdO was put to thermal treatment for the purpose of changing its properties. The CdO layer was removed after carrying out the activation and recrystallization.
Keywords :
II-VI semiconductors; X-ray diffraction; X-ray photoelectron spectra; cadmium compounds; evaporation; photoconducting materials; recrystallisation; scanning electron microscopy; vacuum deposition; wide band gap semiconductors; CdO; CdO layer; CdS; II-VI semiconductors; SEM; XPS; XRD; heterostructure; photoconductive CdS layers; pulse rate laser treatment; recrystallization; thermal treatment; vacuum thermal evaporation; Crystallization; Detectors; Optical pulses; Photoconductivity; Photovoltaic cells; Powders; Scanning electron microscopy; Surface treatment; X-ray diffraction; X-ray scattering;
Conference_Titel :
Electronics Technology, 30th International Spring Seminar on
Conference_Location :
Cluj-Napoca
Print_ISBN :
987-1-4244-1218-1
Electronic_ISBN :
987-1-4244-1218-1
DOI :
10.1109/ISSE.2007.4432851
