DocumentCode :
2796493
Title :
Effect of Lead-free Conductive Thick Film Materials on Ultrasonic Wire Bondability
Author :
Hejatkova, Edita ; Novotny, Marek ; Szendiuch, Ivan
Author_Institution :
Bmo Univ. of Technol., Brno
fYear :
2007
fDate :
9-13 May 2007
Firstpage :
339
Lastpage :
341
Abstract :
The extent of wire bond ability of thick and thin film materials is determined by their mechanical properties. In the year 2006, there were introduced in EU new legislative regulations RoHS for materials used in electronics that have to exclude using of some chemicals, as for example Pb. This paper deals with verification of bondability and reliability of wire bonding ultrasonic process for lead-free thick film conductive materials. There were used some mechanical tests in the combination with temperature cycle aging. This testing was applied on two conductive thick film materials, one old and other lead free new.
Keywords :
conducting materials; integrated circuit bonding; integrated circuit reliability; lead bonding; mechanical testing; thick films; thin films; ultrasonic applications; EU new legislative regulations RoHS; lead-free conductive thick film materials; mechanical testing; microelectronics; reliability; temperature cycle aging; thin film materials; ultrasonic wire bondability; Bonding; Chemical processes; Conducting materials; Conductive films; Environmentally friendly manufacturing techniques; Lead; Materials reliability; Mechanical factors; Thick films; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology, 30th International Spring Seminar on
Conference_Location :
Cluj-Napoca
Print_ISBN :
987-1-4244-1218-1
Electronic_ISBN :
987-1-4244-1218-1
Type :
conf
DOI :
10.1109/ISSE.2007.4432875
Filename :
4432875
Link To Document :
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