Title :
R&M of Systems With Exponential Time Densities
Author :
Mendez, Ignacio O.
Author_Institution :
Lockheed Missiles & Space Company, Inc., Sunnyvale
Keywords :
Availability; Condition monitoring; Creep; Electronic equipment; Exponential distribution; Fatigue; Group technology; Missiles; Probability density function; Steady-state;
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
DOI :
10.1109/RAMS.1984.764296