Wide-band Antireflection Coatings upon Si/HgCdTe Photosensitive Structures for Middle Wavelength IR

Author

Nenkov, M. ; Gyoch, B. ; Pencheva, T.

Author_Institution

Univ. of Rousse, Rousse

fYear

2007

fDate

9-13 May 2007

Firstpage

377

Lastpage

382

Abstract

The investigation deals with problems of computer-aided design of wide-band antireflection coatings for semiconductor photo receiving devices (discrete photo receivers, IR photo receivers´ arrays) based on HgCdTe photosensitive material with optical windows from Si for the middle wavelength infrared spectral region (3 mum - 5 mum). Wide-band antireflection multilayer structures from two materials transparent in upper mentioned spectral region with high and low refractive index are designed and compared.

Keywords

CAD; antireflection coatings; cadmium compounds; infrared spectra; mercury compounds; optical materials; optical multilayers; optical receivers; optical windows; refractive index; semiconductor devices; silicon; tellurium compounds; HgCdTe-Si; IR photo receiver arrays; computer-aided design; discrete photo receivers; optical windows; photosensitive material; refractive index; semiconductor photo receiving devices; wide-band antireflection coatings; Coatings; Design automation; Optical arrays; Optical devices; Optical materials; Optical receivers; Optical refraction; Optical variables control; Semiconductor materials; Wideband;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Technology, 30th International Spring Seminar on

Conference_Location

Cluj-Napoca

Print_ISBN

987-1-4244-1218-1

Electronic_ISBN

987-1-4244-1218-1

Type

conf

DOI

10.1109/ISSE.2007.4432883

Filename

4432883