Title :
Choosing a Practical MTTF Model for ECC Memory Chip
Author :
Koo, D.Y. ; Chenoweth, H.B.
Author_Institution :
Westinghouse Electric Corporation, Baltimore
Keywords :
Circuits; Data analysis; Educational institutions; Error correction; Error correction codes; Failure analysis; Predictive models; Redundancy; Reliability engineering; Visualization;
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
DOI :
10.1109/RAMS.1984.764301
