DocumentCode :
2796657
Title :
Assess your program for probability of success using the reliability scorecard tool
Author :
Miller, R.J. ; Green, Jan ; Herrmann, David ; Heer, Darvin
Author_Institution :
Raytheon Co., McKinney, TX, USA
fYear :
2004
fDate :
26-29 Jan. 2004
Firstpage :
641
Lastpage :
646
Abstract :
Newly developed systems are typically subjected to customer observed tests to demonstrate specified parameters such as functional performance, operational environments, and reliability. Systems presented to such tests prematurely may experience excessive failures, resulting in cost and schedule problems as well as customer dissatisfaction. A leading indicator is needed which can be applied early in the program and periodically during development to project the likelihood of reliability success. The reliability scorecard is an assessment of reliability program tasks, both planned and completed, that has been correlated to achievement of customer required field reliability. The reliability scorecard is not a different, better, higher fidelity reliability prediction. This paper describes how the scorecard was developed and how it can be used to forecast, with confidence, the likelihood of meeting field reliability requirements during customer observed trials. The scorecard concept is applicable to commercial and military programs. It has been validated on diverse programs within Raytheon representing radar systems, airborne and ground electrooptics (EO) systems, mobile satellite terminals, and missiles for the army, navy, and air force.
Keywords :
failure analysis; probability; reliability; airborne electrooptics systems; functional performance; ground electrooptics systems; leading indicator; mobile satellite terminals; operational environment; radar system; reliability; reliability program tasks; reliability scorecard tool; Airborne radar; Costs; Military satellites; Missiles; Performance analysis; Productivity; Reliability engineering; Spaceborne radar; System testing; Table lookup;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability, 2004 Annual Symposium - RAMS
Print_ISBN :
0-7803-8215-3
Type :
conf
DOI :
10.1109/RAMS.2004.1285519
Filename :
1285519
Link To Document :
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