DocumentCode :
2796739
Title :
Integration of BIT Effectiveness with FMECA
Author :
Collett, Ronald E. ; Bachant, Peter W.
Author_Institution :
Electronic Test, Boston
fYear :
1984
fDate :
1984
Firstpage :
300
Lastpage :
305
Keywords :
Circuit testing; Electronic equipment testing; Failure analysis; Information analysis; Measurement standards; Military standards; Performance analysis; Personnel; System testing; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
Type :
conf
DOI :
10.1109/RAMS.1984.764308
Filename :
764308
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2796739
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