• DocumentCode
    2796749
  • Title

    Multi-sources electron probe image fusion based on Wedgelet

  • Author

    Li, Xiang ; Tang, Wei ; Liu, Feng-yu

  • Author_Institution
    Dept. of Comput., Nanjing Univ. of Sci. & Technol., Nanjing
  • Volume
    7
  • fYear
    2008
  • fDate
    12-15 July 2008
  • Firstpage
    4103
  • Lastpage
    4107
  • Abstract
    This paper, based on the analysis of the features of electron probe image, expatiates on image fusion applied to electron probe multi-source image process and popular wavelet, and tries to use the method of Wedgelet new wavelet transposition to combine two electron probe image. Experiments show that, multi-source electron probe process is more overall, more precise than any single-source image, which is good for further image analysis and process such as identical micro surface target recognition, impurity feature extraction and etc.
  • Keywords
    image fusion; wavelet transforms; electron probe multi-source image process; micro surface target recognition; multi-sources electron probe image fusion; wavelet transposition; wedgelet; Electron beams; Image analysis; Image color analysis; Image fusion; Optical scattering; Ores; Probes; Surface morphology; Surface topography; Wavelet analysis; Electron Probe; Image Fusion; Wavelet Transposition; Wedgelet Transposition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics, 2008 International Conference on
  • Conference_Location
    Kunming
  • Print_ISBN
    978-1-4244-2095-7
  • Electronic_ISBN
    978-1-4244-2096-4
  • Type

    conf

  • DOI
    10.1109/ICMLC.2008.4621120
  • Filename
    4621120