DocumentCode :
2796749
Title :
Multi-sources electron probe image fusion based on Wedgelet
Author :
Li, Xiang ; Tang, Wei ; Liu, Feng-yu
Author_Institution :
Dept. of Comput., Nanjing Univ. of Sci. & Technol., Nanjing
Volume :
7
fYear :
2008
fDate :
12-15 July 2008
Firstpage :
4103
Lastpage :
4107
Abstract :
This paper, based on the analysis of the features of electron probe image, expatiates on image fusion applied to electron probe multi-source image process and popular wavelet, and tries to use the method of Wedgelet new wavelet transposition to combine two electron probe image. Experiments show that, multi-source electron probe process is more overall, more precise than any single-source image, which is good for further image analysis and process such as identical micro surface target recognition, impurity feature extraction and etc.
Keywords :
image fusion; wavelet transforms; electron probe multi-source image process; micro surface target recognition; multi-sources electron probe image fusion; wavelet transposition; wedgelet; Electron beams; Image analysis; Image color analysis; Image fusion; Optical scattering; Ores; Probes; Surface morphology; Surface topography; Wavelet analysis; Electron Probe; Image Fusion; Wavelet Transposition; Wedgelet Transposition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Machine Learning and Cybernetics, 2008 International Conference on
Conference_Location :
Kunming
Print_ISBN :
978-1-4244-2095-7
Electronic_ISBN :
978-1-4244-2096-4
Type :
conf
DOI :
10.1109/ICMLC.2008.4621120
Filename :
4621120
Link To Document :
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