• DocumentCode
    2796809
  • Title

    Low-loss wavelength locking of a 49-element single mode diode laser bar with phase-plate beam correction

  • Author

    Trela, N. ; Baker, H.J. ; McBride, R. ; Hall, D.R.

  • Author_Institution
    Sch. of Eng. & Phys. Sci., Heriot Watt Univ., Edinburgh, UK
  • fYear
    2009
  • fDate
    14-19 June 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The paper reports on the use of dual-axis correction for a full-length diode laser bar from Bookham, with 49 single mode emitters and 30 W cw output at 975 nm. Fast-axis smile and lens error correction is combined with laser-cut slow axis collimation to give highly parallel beams with far-field divergence of 2.6 mrad (fast axis) and 13 mrad (slow-axis). Result shows the improvement in fast-axis divergence, in the form of far-field pattern vs. emitter number. Wavelength locking of the ultra-collimated single-mode array is investigated, using a volume Bragg grating (VBG) with 15% diffraction efficiency and 200 pm bandwidth from Ondax Inc. The single-mode emitters require better collimation than the more usual BA emitters for efficient feedback from the VBG, due to their small aperture (1 x 5 mum). The power loss associated with the VBG insertion and locking is less than 10%, lower than the nominal reflectivity of the grating.
  • Keywords
    Bragg gratings; laser mode locking; laser modes; lenses; optical collimators; optical losses; semiconductor laser arrays; diffraction efficiency; efficiency 15 percent; lens error correction; phase-plate beam correction; power loss; reflectivity; single mode diode laser bar; single-mode array; slow axis collimation; volume Bragg grating; wavelength locking; Bandwidth; Bragg gratings; Collimators; Diffraction gratings; Diode lasers; Error correction; Laser beams; Laser mode locking; Lenses; Semiconductor laser arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-4079-5
  • Electronic_ISBN
    978-1-4244-4080-1
  • Type

    conf

  • DOI
    10.1109/CLEOE-EQEC.2009.5192658
  • Filename
    5192658