• DocumentCode
    2796830
  • Title

    Hiding information inside structured shapes

  • Author

    Das, Samarjit ; Rane, Shantanu ; Vetro, Anthony

  • Author_Institution
    Iowa State Univ., Ames, IA, USA
  • fYear
    2010
  • fDate
    14-19 March 2010
  • Firstpage
    1782
  • Lastpage
    1785
  • Abstract
    This paper describes a new technique for embedding a message within structured shapes. It is desired that any changes in the shape owing to the embedded message are invisible to a casual observer but detectable by a specialized decoder. The message embedding algorithm represents shape outlines as a set of cubic Bezier curves and straight line segments. By slightly perturbing the Bezier curves, a single shape can spawn a library of similar-looking shapes each corresponding to a unique message. This library is efficiently stored using Adaptively Sampled Distance Fields (ADFs) which also facilitate rendering of the modified shapes at the desired resolution and fidelity. Given any modified shape, a forensic detector applies Procrustes analysis to determine the embedded message. Results of an extensive subjective test confirm that the shape modifications are indeed unobtrusive. Further, to test the recovery of the message bits in noisy physical environments, a text document is put through a print-photocopy-scan process. Message recovery is found to be stable even after multiple rounds of photocopying.
  • Keywords
    computational geometry; data encapsulation; message authentication; rendering (computer graphics); adaptively sampled distance field; cubic Bezier curves; information forensic; information hiding; message embedding algorithm; procrustes analysis; rendering; Data encapsulation; Data mining; Data structures; Degradation; Forensics; Graphics; Multi-stage noise shaping; Noise robustness; Printers; Shape; Bezier Curve; Data Hiding; Information Forensics; Procrustes Distance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics Speech and Signal Processing (ICASSP), 2010 IEEE International Conference on
  • Conference_Location
    Dallas, TX
  • ISSN
    1520-6149
  • Print_ISBN
    978-1-4244-4295-9
  • Electronic_ISBN
    1520-6149
  • Type

    conf

  • DOI
    10.1109/ICASSP.2010.5495425
  • Filename
    5495425