Title :
Some factors concerning the input admittance method of diagnosing plasmas
Author :
Hatcher, D.M. ; Swift, C.
Author_Institution :
NASA Langley Research Center, Hampton, VA, USA
Keywords :
Admittance; Antenna measurements; Flanges; Frequency measurement; Planar waveguides; Plasma diagnostics; Plasma measurements; Plasma waves; Plugs; Yttrium;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1966
DOI :
10.1109/APS.1966.1150372
