DocumentCode
2796833
Title
Some factors concerning the input admittance method of diagnosing plasmas
Author
Hatcher, D.M. ; Swift, C.
Author_Institution
NASA Langley Research Center, Hampton, VA, USA
Volume
4
fYear
1966
fDate
24442
Firstpage
106
Lastpage
112
Keywords
Admittance; Antenna measurements; Flanges; Frequency measurement; Planar waveguides; Plasma diagnostics; Plasma measurements; Plasma waves; Plugs; Yttrium;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1966
Type
conf
DOI
10.1109/APS.1966.1150372
Filename
1150372
Link To Document