Title :
Research and Development for Logistics Support
Author :
Boenning, R.A. ; Morris, V.B., Jr.
Author_Institution :
CPL, Westinghouse ILSD, Baltimore
Keywords :
Circuit testing; Electronic equipment testing; Laser beams; Logistics; Optical interferometry; Optical waveguides; Printed circuits; Research and development; System testing; Transducers;
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
DOI :
10.1109/RAMS.1984.764318