DocumentCode :
2797016
Title :
Designing Built-In Test for Microprocessors
Author :
Smoot, Sterling
Author_Institution :
Baltimore
fYear :
1984
fDate :
1984
Firstpage :
412
Lastpage :
415
Keywords :
Built-in self-test; Central Processing Unit; Circuit testing; Hardware; Microprocessors; Microprogramming; Performance evaluation; Read only memory; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
Type :
conf
DOI :
10.1109/RAMS.1984.764327
Filename :
764327
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2797016
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