DocumentCode :
2797074
Title :
Sensitivity in Weibull System Reliability Models
Author :
Nachlas, Joel A. ; Gruber, Stephen S. ; Wiesel, Harry Z.
Author_Institution :
Virginia Tech, Blacksburg
fYear :
1984
fDate :
1984
Firstpage :
428
Lastpage :
433
Keywords :
Acceleration; Central Processing Unit; Degradation; Fasteners; Parameter estimation; Predictive models; Reliability; Sensitivity analysis; System testing; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
Type :
conf
DOI :
10.1109/RAMS.1984.764330
Filename :
764330
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2797074
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