Title :
Sensitivity in Weibull System Reliability Models
Author :
Nachlas, Joel A. ; Gruber, Stephen S. ; Wiesel, Harry Z.
Author_Institution :
Virginia Tech, Blacksburg
Keywords :
Acceleration; Central Processing Unit; Degradation; Fasteners; Parameter estimation; Predictive models; Reliability; Sensitivity analysis; System testing; Weibull distribution;
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
DOI :
10.1109/RAMS.1984.764330