Title :
An Approach to Reliability Growth Without Dedicated Testing: A Case History and Some Results
Author :
Bentz, Richard W. ; Hutchinson, Major Leonard T
Author_Institution :
The MITRE Corporation, Bedford
Keywords :
Computer aided software engineering; Data communication; Data engineering; Design engineering; Electronic equipment; Hardware; History; Military computing; Reliability engineering; System testing;
Conference_Titel :
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
DOI :
10.1109/RAMS.1984.764335
