DocumentCode
2797347
Title
Quality, Reliability and Stress Testing
Author
Evans, Jerry E.
Author_Institution
IBM, East Fishkill
fYear
1984
fDate
1984
Firstpage
525
Lastpage
529
Keywords
Acceleration; Circuit testing; Integrated circuit reliability; Integrated circuit testing; Life estimation; Reliability engineering; Semiconductor device reliability; Stress; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1984. Proceedings. Annual
Type
conf
DOI
10.1109/RAMS.1984.764347
Filename
764347
Link To Document