DocumentCode :
2797421
Title :
Economic tradeoffs of in-circuit and functional testing
Author :
Mrowiec, Terry
fYear :
1978
fDate :
1978
Firstpage :
128
Lastpage :
133
Keywords :
Automatic testing; Circuit testing; Costs; Electronic equipment testing; Electronics industry; Environmental economics; Large scale integration; Production; System testing; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
Type :
conf
DOI :
10.1109/AUTEST.1978.764353
Filename :
764353
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2797421
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