• DocumentCode
    2797450
  • Title

    A systematic approach to test and fault isolation of digital avionics

  • Author

    Lee, Edward C. ; Schmaltz, Carl A.

  • Author_Institution
    Westinghouse Electric Corporation, Integrated Logistics Support Division
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    143
  • Lastpage
    146
  • Keywords
    Aerospace electronics; Circuit faults; Circuit testing; Clocks; Clutter; Digital signal processing; Digital signal processors; Signal processing; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '78. International Automatic Testing Conference
  • Type

    conf

  • DOI
    10.1109/AUTEST.1978.764355
  • Filename
    764355
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2797450