DocumentCode :
2797450
Title :
A systematic approach to test and fault isolation of digital avionics
Author :
Lee, Edward C. ; Schmaltz, Carl A.
Author_Institution :
Westinghouse Electric Corporation, Integrated Logistics Support Division
fYear :
1978
fDate :
1978
Firstpage :
143
Lastpage :
146
Keywords :
Aerospace electronics; Circuit faults; Circuit testing; Clocks; Clutter; Digital signal processing; Digital signal processors; Signal processing; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
Type :
conf
DOI :
10.1109/AUTEST.1978.764355
Filename :
764355
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2797450
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