DocumentCode :
279757
Title :
Physical modelling of GaAs photodiodes
Author :
Barry, D.M. ; Snowden, C.M. ; Howes, M.J.
fYear :
1990
fDate :
32916
Firstpage :
42370
Lastpage :
42376
Abstract :
The bipolar drift-diffusion model of an ITO/GaAs Schottky photodiode has been used to demonstrate the importance of photogenerated charge build up within the photodiode when used in detecting high bit rate digital signals. This causes an asymmetrical response affecting the detected high and low levels which become dependent on the digital pulse pattern. Optical illumination at wavelengths ⩽880 nm is through the ITO which is transparent to these frequencies. These devices have been fabricated where the depth of the intrinsic n- layer ranges from 10 μm to 0.45 μm with the smallest having a reported bandwidth of 110 GHz
fLanguage :
English
Publisher :
iet
Conference_Titel :
Modelling of Optoelectronic Devices, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
189791
Link To Document :
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