DocumentCode
2797609
Title
Linear search algorithm for repair analysis with 4 spare row/4 spare column
Author
Kwon, Hyeokman ; Moon, Joohyeong ; Byun, Jinsoo ; Park, Sangwook ; Chung, Jinyong
Author_Institution
Hyundai Electron. Ind. Co. Ltd., Ichon, South Korea
fYear
2000
fDate
2000
Firstpage
269
Lastpage
272
Abstract
An intelligent method of repair analysis that can repair a RAM block with 4 spare rows and 4 spare columns is implemented with CAM that has the function of datamatch, count-sub-entry, search-empty-entry. The key idea of this algorithm is on-the-fly repair analysis by rearrangement of the CAM array contents and repair analysis processing by one row or one column unit with a dual error buffer
Keywords
content-addressable storage; design for testability; integrated circuit reliability; integrated memory circuits; memory architecture; random-access storage; redundancy; CAM; CAM array contents; RAM block repair; count-sub-entry; datamatch; dual error buffer; failure bitmap; intelligent method; linear search algorithm; repair analysis; search-empty-entry; Algorithm design and analysis; Built-in self-test; CADCAM; Computer aided manufacturing; Costs; Logic; Random access memory; Read-write memory; Redundancy; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ASICs, 2000. AP-ASIC 2000. Proceedings of the Second IEEE Asia Pacific Conference on
Conference_Location
Cheju
Print_ISBN
0-7803-6470-8
Type
conf
DOI
10.1109/APASIC.2000.896960
Filename
896960
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