Title :
An automatic in-process microcircuit evaluation (aime) system
Author :
Wildenberger, R.J. ; Dudziak, T.J. ; Kelly, J.F.
Author_Institution :
RCA Corporation
Keywords :
Assembly systems; Automatic testing; Circuits; Costs; Inspection; Microscopy; Military computing; Printing; Substrates; System testing;
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
DOI :
10.1109/AUTEST.1978.764375
