DocumentCode
2797810
Title
Fast testing and trimming of a/d and d/a converters in automatic test systems
Author
Pau, L.F.
Author_Institution
E.N.S. Telecommunications, Department of Electronics and Physics
fYear
1978
fDate
1978
Firstpage
268
Lastpage
274
Keywords
Analog-digital conversion; Automatic testing; Availability; Digital-analog conversion; Electronic equipment testing; Linearity; Physics; System testing; Temperature; Voltmeters;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '78. International Automatic Testing Conference
Type
conf
DOI
10.1109/AUTEST.1978.764379
Filename
764379
Link To Document