DocumentCode :
2797810
Title :
Fast testing and trimming of a/d and d/a converters in automatic test systems
Author :
Pau, L.F.
Author_Institution :
E.N.S. Telecommunications, Department of Electronics and Physics
fYear :
1978
fDate :
1978
Firstpage :
268
Lastpage :
274
Keywords :
Analog-digital conversion; Automatic testing; Availability; Digital-analog conversion; Electronic equipment testing; Linearity; Physics; System testing; Temperature; Voltmeters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '78. International Automatic Testing Conference
Type :
conf
DOI :
10.1109/AUTEST.1978.764379
Filename :
764379
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2797810
بازگشت