• DocumentCode
    2797829
  • Title

    Force sensor using carbon nanotubes directly synthesized on micro structure

  • Author

    Takei, Y. ; Matsumoto, K. ; Shimoyama, I.

  • Author_Institution
    Univ. of Tokyo, Tokyo
  • fYear
    2007
  • fDate
    21-25 Jan. 2007
  • Firstpage
    827
  • Lastpage
    830
  • Abstract
    We have achieved to fabricate a force sensor using carbon nanotubes (CNTs) as a sensing element which directly synthesized on silicon micro structure. Generally, electrical resistance of the CNT increases when its length changes from its original length. We measured the electrical resistance change of the CNTs to detect the force applied on the CNTs. We fabricated Si beam structure on top silicon layer of the SOI wafer. The CNTs were directly synthesized between the Si beam and the bottom Si layer (bridging CNTs) by chemical vapor deposition (CVD). After we synthesized bridging CNTs on the structure, we infiltrated and cured the PDMS prepolymer solution (polydimethylsiloxane) on the surface of the beam structure and the bridging CNTs, so that we can detect force without any damage to the sensing element. As a result, the electrical resistance of the bridging CNTs changes by 3.2% for a 4.9 N force applied on the beam. In conclusion, the electrical resistance of the bridging CNTs increases according to the force applied on the beam, and our proposed force sensor can detect a force.
  • Keywords
    carbon nanotubes; chemical vapour deposition; electric resistance; force sensors; polymers; silicon; PDMS prepolymer solution; Si; carbon nanotube; chemical vapor deposition; electrical resistance; force sensor; polydimethylsiloxane; silicon beam structure; silicon microstructure; Carbon nanotubes; Chemical elements; Chemical vapor deposition; Electric resistance; Electric variables measurement; Electrical resistance measurement; Force measurement; Force sensors; Silicon; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2007. MEMS. IEEE 20th International Conference on
  • Conference_Location
    Hyogo
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-095-5
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2007.4433003
  • Filename
    4433003