DocumentCode
2797893
Title
FITMOS modeling and dynamic on-state characteristic evaluation
Author
Li, Wei ; Page, William ; Perreault, David J.
Author_Institution
Lab. for Electromagn. & Electron. Syst., Massachusetts Inst. of Technol., Cambridge, MA, USA
fYear
2010
fDate
12-16 Sept. 2010
Firstpage
378
Lastpage
385
Abstract
This paper presents a study of the detailed characteristics of the new Floating Island and Thick Bottom Oxide Trench Gate MOSFET (FITMOS) developed at Toyota. FITMOS has tremendous potential for automotive applications due to its low on-resistance, improved temperature coefficient of resistance and low gate charge. During the study, the key characteristics of this novel FITMOS were investigated; a behavioral model was developed in SPICE for simulation and optimization purposes, and their applications in the design of automotive power electronics was explored. In this study, we also identify a previously unrecognized phenomenon in the FITMOS MOSFET. In particular, we show that the on-state resistance of the device depends on both frequency and peak di/dt at a given frequency. This dynamic on-resistance variation can have a significant application impact.
Keywords
MOSFET; power electronics; SPICE; automotive power electronics; dynamic on-state characteristic evaluation; floating island and thick bottom oxide trench gate MOSFET; low gate charge; temperature coefficient; Capacitance; Converters; Current measurement; Logic gates; MOSFET circuits; Mathematical model; Numerical models; AC characteristics; DC-DC converters; FITMOS; I-V characteristics; capacitance modeling; on-resistance; optimization; reverse recovery; soft switching;
fLanguage
English
Publisher
ieee
Conference_Titel
Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
Conference_Location
Atlanta, GA
Print_ISBN
978-1-4244-5286-6
Electronic_ISBN
978-1-4244-5287-3
Type
conf
DOI
10.1109/ECCE.2010.5618005
Filename
5618005
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