Title :
A resonant technique to measure the dielectric properties of planar materials
Author :
Humbert, W.R. ; Scott, W.R., Jr.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A previously introduced resonant measurement technique is extended to include dielectric sheets. The technique it is not limited by the sheet´s thickness or dielectric constant because it involves a full-wave analysis of the fixture. A method to account for conduction loss due to the surface resistance of the metal walls of the fixture is presented. Experimental results are presented and compared to previously reported values and are in excellent agreement.
Keywords :
cavity resonators; materials testing; permittivity measurement; resonance; Al/sub 2/O/sub 3/; LaAlO/sub 3/; cavity resonator; conduction loss; dielectric constant; dielectric properties measurement; dielectric sheets; experimental results; full-wave analysis; metal walls; planar materials; resonant measurement technique; surface resistance; thickness; Air gaps; Dielectric constant; Dielectric materials; Dielectric measurements; Electromagnetic measurements; Electromagnetic waveguides; Fixtures; Permittivity measurement; Resonance; Sheet materials;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1997. IEEE., 1997 Digest
Conference_Location :
Montreal, Quebec, Canada
Print_ISBN :
0-7803-4178-3
DOI :
10.1109/APS.1997.625433
