A resonant technique to measure the dielectric properties of planar materials

Author

Humbert, W.R. ; Scott, W.R., Jr.

Author_Institution

Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

Volume

4

fYear

1997

fDate

13-18 July 1997

Firstpage

2316

Abstract

A previously introduced resonant measurement technique is extended to include dielectric sheets. The technique it is not limited by the sheet´s thickness or dielectric constant because it involves a full-wave analysis of the fixture. A method to account for conduction loss due to the surface resistance of the metal walls of the fixture is presented. Experimental results are presented and compared to previously reported values and are in excellent agreement.

Keywords

cavity resonators; materials testing; permittivity measurement; resonance; Al/sub 2/O/sub 3/; LaAlO/sub 3/; cavity resonator; conduction loss; dielectric constant; dielectric properties measurement; dielectric sheets; experimental results; full-wave analysis; metal walls; planar materials; resonant measurement technique; surface resistance; thickness; Air gaps; Dielectric constant; Dielectric materials; Dielectric measurements; Electromagnetic measurements; Electromagnetic waveguides; Fixtures; Permittivity measurement; Resonance; Sheet materials;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 1997. IEEE., 1997 Digest

Conference_Location

Montreal, Quebec, Canada

Print_ISBN

0-7803-4178-3

Type

conf

DOI

10.1109/APS.1997.625433

Filename

625433