• DocumentCode
    2798080
  • Title

    Nanoelectromechanical systems: Potential, progress, & projections

  • Author

    Roukes, M.L.

  • Author_Institution
    California Inst. of Technol., Pasadena
  • fYear
    2007
  • fDate
    21-25 Jan. 2007
  • Firstpage
    93
  • Lastpage
    94
  • Abstract
    Nanoelectromechanical systems (NEMS) represent the next regime of size reduction beyond the microscale for mechanical devices. In their tiniest, ultimate realization, NEMS will be formed with sub-nanometer scale precision from atomic- and molecular-scale mechanical elements as first envisaged by Feynman (1). Although nanowire and nanotube based NEMS today verge on this domain, their assembly into functional devices remains more of an art than a science, as they are typically fabricated one-by-one by complicated means with low yield. By contrast, the most robust forms of NEMS are currently patterned by top-down methods; in fact their production is now being scaled to enable large-scale integration over 200 mm wafers with minimum feature sizes that are below 50 nm. In this paper I will describe how nanoscale mechanical elements provide benefits beyond the obvious, that is, benefits in addition to the possibility of increased device density. The reduced size of NEMS enables mechanical functionality that completely transcends what is possible at the microscale with MEMS (2). However, size reduction to the nanoscale may not be a panacea for all applications - for some applications larger may still be better!
  • Keywords
    microsensors; nanoelectronics; NEMS; device density; nanoelectromechanical systems; Biomedical engineering; Fluctuations; Frequency; Geometry; Micromechanical devices; Nanoelectromechanical systems; Nanoscale devices; Physics; Signal processing; Thermal force;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2007. MEMS. IEEE 20th International Conference on
  • Conference_Location
    Hyogo
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-095-5
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2007.4433022
  • Filename
    4433022