Title :
Statistical design in integrated optics
Author :
Melloni, Andrea ; Roncelli, Davide ; Morichetti, Francesco ; Canciamilla, Antonio ; Bakker, Arjen
Author_Institution :
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
Abstract :
The ´design on tolerance´ concept in integrated optic is introduced. The aim of this technique is to design a circuit that is robust to statistical variations of the parameters due to technological processes and aging. The numerical technique permits to design a generic circuit that maximizes the yield of the production process and at the same time locates the most critical parameters of the circuit.
Keywords :
integrated circuit design; integrated optics; statistical analysis; generic circuit design; integrated optics; production process; statistical variations; Circuit simulation; Design optimization; Electromagnetic modeling; Integrated circuit technology; Integrated circuit yield; Integrated optics; Optical design; Optical filters; Optical scattering; Very large scale integration;
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
DOI :
10.1109/CLEOE-EQEC.2009.5192739
