• DocumentCode
    2798324
  • Title

    Robust automatic void detection in solder balls

  • Author

    Said, Asaad F. ; Bennett, Bonnie L. ; Karam, Lina J. ; Pettinato, Jeff

  • Author_Institution
    Sch. of Electr., Comput.,&Energy Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2010
  • fDate
    14-19 March 2010
  • Firstpage
    1650
  • Lastpage
    1653
  • Abstract
    Voids in solder balls can cause board failures. The detection and assessment of voids in solder balls can help in reducing board yield issues caused by incorrect scrapping and rework. X-ray imaging machines make voids visible to the operator for manual inspection. Some existing x-ray inspection systems have void detection algorithms that require the use of intensive manual tuning operations that are time consuming, and inaccurate due to the inability to examine balls overshadowed with other components. In this paper, a robust automatic void detection algorithm is proposed. The proposed method is able to detect voids with different sizes inside the solder balls, including the ones that are overshadowed by board components and under different brightness conditions. Results show that the proposed method achieves a correlation squared in the range of 91% to 97% with ground truth data from a 3D x-ray scan. The proposed algorithm is fully automated and benefits the manufacturing process by reducing operator effort and by providing a cost effective solution to improve output quality.
  • Keywords
    X-ray imaging; manufacturing processes; printed circuits; solders; voids (solid); 3D X-ray scan; board failures; cost effective solution; manufacturing process; printed circuit boards; robust automatic void detection algorithm; solder balls; Brightness; Detection algorithms; Humans; Image segmentation; Inspection; Interference; Robustness; X-ray detection; X-ray detectors; X-ray imaging; BGA; Voids Detection; features extraction; segmentation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics Speech and Signal Processing (ICASSP), 2010 IEEE International Conference on
  • Conference_Location
    Dallas, TX
  • ISSN
    1520-6149
  • Print_ISBN
    978-1-4244-4295-9
  • Electronic_ISBN
    1520-6149
  • Type

    conf

  • DOI
    10.1109/ICASSP.2010.5495524
  • Filename
    5495524