Title :
Estimation of internal junction temperature & thermal resistance of light-emitting diodes using external luminous flux measurements
Author :
Tao, X.H. ; Li, S.N. ; Hui, S.Y.R.
Author_Institution :
Centre for Power Electron., City Univ. of Hong Kong, Hong Kong, China
Abstract :
Although critical to the lifetime of LED, the junction temperature of LED cannot be measured easily. From the general photo-electro-thermal theory for LED systems, new equations for estimating the internal junction temperature Tj and junction-case thermal resistance Rjc of LED from the luminous flux measurements, which can be obtained relatively easily, are presented and verified practically. These equations provide a valuable tool for checking Tj in LED system design without expensive equipment.
Keywords :
LED displays; LED lamps; photometry; thermal resistance; LED internal junction temperature estimation; LED thermal resistance; external luminous flux measurements; light emitting diodes; photoelectrothermal theory; Electrical resistance measurement; Heating; Junctions; Light emitting diodes; Power measurement; Temperature measurement; Thermal resistance; LED system theory; Light-emitting diodes; lighting;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-5286-6
Electronic_ISBN :
978-1-4244-5287-3
DOI :
10.1109/ECCE.2010.5618051